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Optical absorption and light scattering in microcrystalline silicon thin films and solar cells
Auteur(s)
Poruba, A.
Fejfar, A.
Remeš, Z.
Špringer, J.
Vaněček, M.
Kočka, J.
Meier, J.
Torres, P.
Shah, Arvind
Date de parution
2000
In
Journal of Applied Physics, American Institute of Physics (AIP), 2000/88/1/148-160
Résumé
Optical characterization methods were applied to a series of microcrystalline silicon thin films and solar cells deposited by the very high frequency glow discharge technique. Bulk and surface light scattering effects were analyzed. A detailed theory for evaluation of the optical absorption coefficient α from transmittance, reflectance and absorptance (with the help of constant photocurrent method) measurements in a broad spectral region is presented for the case of surface and bulk light scattering. The spectral dependence of α is interpreted in terms of defect density, disorder, crystalline/amorphous fraction and material morphology. The enhanced light absorption in microcrystalline silicon films and solar cells is mainly due to a longer optical path as the result of an efficient diffuse light scattering at the textured film surface. This light scattering effect is a key characteristic of efficient thin-film-silicon solar cells.
Identifiants
Type de publication
journal article
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