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Angle-scanned photoemission: Fermi surface mapping and structural determination
Auteur(s)
Aebi, Philipp
Fasel, Roman
Naumovic, D.
Hayoz, J.
Pillo, Th.
Bovet, M
Agostino, R. G.
Patthey, L.
Schlapbach, Louis
Gil, F. P.
Berger, Helmuth
Kreutz, T. J.
Osterwalder, Jürg
Date de parution
1998
In
Surface Science, Elsevier, 1998/402-404//614-622
Résumé
A brief survey of the angle-scanned photoemission technique is given. It incorporates two complementary methods in one: <br><br> 1. Mapping of X-ray excited photoelectron intensities over virtually the complete hemisphere above the sample surface results in extended data sets where important surface-geometrical structure information is extracted and even “fingerprinting” is possible. This method is known as the very powerful angle-scanned X-ray photoelectron diffraction. <br><br> 2. Mapping ultraviolet-excited photoelectron intensities as a function of emission angles gives the possibility to do band mapping as well as to study the Fermi surface of single crystals very directly. Therefore, by switching between X-rays and ultraviolet-photons, it is possible to study the geometrical and electronic structure within the same experiment.
Identifiants
Type de publication
journal article
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