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Growth of thin Bi films on W(1 1 0)
Auteur(s)
Koitzsch, Christian
Bovet, M.
Clerc, Florian
Naumovic, D.
Schlapbach, Louis
Aebi, Philipp
Date de parution
2003
In
Surface Science, Elsevier, 2003/527/1-3/51-56
Résumé
We report on the growth of single crystalline epitaxial Bi films on W(1 1 0). X-ray photoelectron diffraction (XPD) and low energy electron diffraction (LEED) reveal that Bi grows well ordered in the pseudocubic (0 0 1) orientation. The two-fold symmetric W(1 1 0) surface supports four different Bi(0 0 1) domains. The multi-domain nature is unambigously detected via LEED showing a peculiar splitting of spots. It is shown that a preferential domain alignment along the [0 0 1]<i>tungsten</i>-direction accounts for this observation and is in agreement with a two-fold XPD pattern.
Identifiants
Type de publication
journal article
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