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Optical properties of microcrystalline materials
Auteur(s)
Vaněček, Milan
Poruba, A.
Remeš, Z.
Beck, N.
Nesládek, M.
Date de parution
1998
In
Journal of Non-Crystalline Solids, Elsevier, 1998/227-230//967-972
Résumé
We use optical, photocurrent and photothermal deflection spectroscopies to study defects in microcrystalline silicon (<i>μc</i>-Si) thin films and diamond layers. Enhanced light absorption in μc-Si films and solar cells is due to several contributions: light scattering, change in the optical transition probability for strained and surface atoms and residual amorphous fraction. Low defect density (optical absorption with a coefficient, <i>α</i>, smaller than 0.1 cm−1 at about 0.8 eV, as measured by the constant photocurrent method), amorphous volume fraction below 10% and a distinct surface texture is typical for a material yielding a good efficiency <i>μc-Si</i> solar cells. Main defects in heteroepitaxial chemical vapor deposition diamond films are discussed.
Identifiants
Type de publication
journal article
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