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Collection of transverse and longitudinal fields by means of apertureless nanoprobes with different metal coating characteristics
Auteur(s)
Descrovi, E.
Vaccaro, L.
Nakagawa, Wataru
Aeschimann, L.
Staufer, U.
Herzig, Hans-Peter
Date de parution
2004
In
Applied Physics Letters, American Institute of Physics (AIP), 2004/85/22/5340-5342
Résumé
The coupling and transmission of transverse and longitudinal fields into apertureless microfabricated near-field optical probes is investigated. Two kinds of probes with different metal coating roughness are considered. Transverse and longitudinal field distributions are obtained by focusing azimuthally and radially polarized beams produced by means of a liquid crystal plate. The focal plane is scanned using microfabricated probes in a collection mode configuration. It is found that the roughness of the metal coating plays an important role in the coupling strength of transverse fields into the probes: the relative coupling efficiency for transverse fields diminishes with a rough metal coating, while that of longitudinal fields does not.
Identifiants
Type de publication
journal article
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