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Scanning spot metrology for testing of photolithographic masks
Auteur(s)
Blattner, Peter
Herzig, Hans-Peter
Sohail, S.
Naqvi, H.
Date de parution
1995
In
Optical Engineering, International Society for Optical Engineering (SPIE), 1995/34/8/2425
Résumé
We investigated an optical method for characterizing submicrometer structures of photolithographic masks, enabling fast and non-destructive testing over large areas. The scanning spot metrology provides accurate information about edge locations of opaque structures on chrome masks. Algorithms for the extraction of edge locations from the detector signal are discussed and applied to the characterization of a modulated grating mask. Local fabrication errors of the order of 10 to 50 nm can be detected.
Identifiants
Type de publication
journal article
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