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Real space mapping of the surface atomic environment via low energy scattering spectroscopy
Auteur(s)
Agostino, R. G.
Aebi, Philipp
Osterwalder, Jürg
Hayoz, J.
Schlapbach, Louis
Date de parution
1997
In
Surface Science, Elsevier, 1997/384/1-3/36-45
Résumé
Low-energy ion scattering spectroscopy is used to obtain real space surface imaging of the atomic surroundings of different fcc metal surfaces. Scattered He<sup>+</sup> ions were mapped over a large solid angle sector. By using an universal shadow cone expression, it is possible to invert the angular maps into two-dimensional real space maps. The inversion procedure is tested on Pt(111), Cu(001) and Al(111) surfaces getting nearest neighbour atoms up to a distance of 4 Å. Furthermore, for known surfaces the maps also allow to extract information on the scattering mechanism itself.
Identifiants
Type de publication
journal article
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