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X-ray photoelectron diffraction study of Cu(1 1 1): Multiple scattering investigation
Auteur(s)
Despont, Laurent
Naumovic, D.
Clerc, Florian
Koitzsch, Christian
Garnier, Michael Bernard Gunnar
Garcia de Abajo, F.J.
Van Hove, M. A.
Aebi, Philipp
Date Issued
2006
Journal
Surface Science, Elsevier, 2006/600/2/380-385
Abstract
Multiple scattering theory based on a cluster model is used to simulate full-hemispherical X-ray photoelectron diffraction measurements in order to verify how state of the art multiple scattering simulations are able to reproduce the experiment. This approach is applied to the Cu(1 1 1) surface for two different photoelectron kinetic energies. Differences and similarities between single and multiple scattering are discussed in comparison with experimental results. We find that the present approach gives very good results despite some limitations.
Publication type
journal article
