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Observation of amplitude and phase in ridge and photonic crystal waveguides operating at 1.55 <i>μ</i>m by use of heterodyne scanning near-field optical microscopy
Auteur(s)
Tortora, Pierpasquale
Editeur(s)
Abashin, M.
Märki, Iwan
Nakagawa, Wataru
Vaccaro, Luciana
Salt, Martin Guy
Herzig, Hans-Peter
Levy, U.
Fainman, Y.
Date de parution
2005
In
Optics Letters, Optical Society of America, 2005/30/21/2885-2887
Résumé
We apply heterodyne scanning near-field optical microscopy (SNOM) to observe with subwavelength resolution the amplitude and phase of optical fields propagating in several microfabricated waveguide devices operating around the 1.55 μm wavelength. Good agreement between the SNOM measurements and predicted optical mode propagation characteristics in standard ridge waveguides demonstrates the validity of the method. In situ observation of the subwavelength-scale distribution and propagation of optical fields in straight and 90° bend photonic crystal waveguides facilitates a more detailed understanding of the optical performance characteristics of these devices and illustrates the usefulness of the technique for investigating nanostructured photonic devices.
Autre version
http://ol.osa.org/abstract.cfm?id=85945
Type de publication
Resource Types::text::journal::journal article
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