Monolithically integrated optical displacement sensor in GaAs/AlGaAs
Zappe, H. P.
Date de parution
Electronics Letters, Institution of Engineering and Technology (IET), 1995/31/24/2121-2122
A monolithically integrated displacement sensor has been fabricated in the GaAs/AlGaAs material system. The device is configured as a Michelson interferometer and consists of a DBR laser, a directional coupler, transparent waveguides and a photodetector. Interference fringes could be seen at a measurement distance of up to 45 cm, requiring only the alignment of an external GRIN lens for beam collimation.
Type de publication
Resource Types::text::journal::journal article