Logo du site
  • English
  • Français
  • Se connecter
Logo du site
  • English
  • Français
  • Se connecter
  1. Accueil
  2. Université de Neuchâtel
  3. Publications
  4. Observation of the reversible H-induced structural transition in thin Y films via x-ray photoelectron diffraction
 
  • Details
Options
Vignette d'image

Observation of the reversible H-induced structural transition in thin Y films via x-ray photoelectron diffraction

Auteur(s)
Hayoz, J.
Sarbach, S.
Pillo, Th.
Boschung, E.
Naumovic, D.
Aebi, Philipp
Schlapbach, Louis
Date de parution
1998
In
Physical Review B, American Physical Society (APS), 1998/58/8/R4270-R4273
Résumé
Yttrium can be loaded with hydrogen up to high concentrations causing dramatic structural and electronic changes of the host lattice. We report on the reversibility of hydrogen loading in thin single-crystalline Y films grown by vapor deposition on W(110). Under a H<sub>2</sub> partial pressure of 1×10<sup>-5</sup> mbar the hexagonal-closed- packed Y films convert to the face-centered-cubic Y dihydride. Unloading is accomplished by annealing the dihydride to 1000 K. No loss of crystallinity is observed during these martensitic transformations of the Y lattice. Moreover, we demonstrate a model to determine the H concentration in Y <i>in situ</i>.
Identifiants
https://libra.unine.ch/handle/123456789/17016
_
10.1103/PhysRevB.58.R4270
Type de publication
journal article
Dossier(s) à télécharger
 main article: Hayoz_J._-_Observation_of_the_reversible_H-induced_20080320.pdf (411.07 KB)
google-scholar
Présentation du portailGuide d'utilisationStratégie Open AccessDirective Open Access La recherche à l'UniNE Open Access ORCIDNouveautés

Service information scientifique & bibliothèques
Rue Emile-Argand 11
2000 Neuchâtel
contact.libra@unine.ch

Propulsé par DSpace, DSpace-CRIS & 4Science | v2022.02.00