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Hydrogenated microcrystalline silicon: how to correlate layer properties and solar cell performance
Auteur(s)
Wyrsch, Nicolas
Feitknecht, Luc
Droz, Corinne
Torres, Pedro
Shah, Arvind
Poruba, A.
Vaněček, Milan
Date de parution
2000
In
Journal of Non-Crystalline Solids, Elsevier, 2000/266-269//1099-1103
Résumé
Undoped hydrogenated microcrystalline silicon (μc-Si:H) layers and cells have been deposited by plasma chemical vapour deposition at low temperature at different powers and silane dilutions. Electronic transport properties and defect density of the layers have been compared to the cell performances to identify the important material properties for solar cell applications. A correlation is found between the defect density, μ<sup>0</sup>τ<sup>0</sup> quality parameter, and cell efficiency. Anisotropy of the transport properties in some μc-Si:H is also demonstrated.
Identifiants
Type de publication
journal article
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