Voici les éléments 1 - 10 sur 33
  • Publication
    Accès libre
    Frequency-comb-referenced two-wavelength source for absolute distance measurement
    (2006)
    Schuhler, Nicolas
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    Salvadé, Yves
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    Lévêque, Samuel
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    Holzwarth, Ronald
    We propose a new tunable laser source concept for multiple-wavelength interferometry, offering an unprecedented large choice of synthetic wavelengths with a relative uncertainty better than 10−11 in vacuum. Two lasers are frequency stabilized over a wide range of frequency intervals defined by the frequency comb generated by a mode-locked fiber laser. In addition, we present experimental results demonstrating the generation of a 90 μm synthetic wavelength calibrated with an accuracy better than 0.2 parts in 106. With this synthetic wavelength we can resolve one optical wavelength, which opens the way to absolute distance measurement with nanometer accuracy.
  • Publication
    Accès libre
    High Resolution Interference Microscopy: A Tool for Probing Optical Waves in the Far-Field on a Nanometric Length Scale
    (2006)
    Rockstuhl, Carsten
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    Märki, Iwan
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    Scharf, Toralf
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    Salt, Martin Guy
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    ;
    High Resolution Interference Microscopy (HRIM) is a technique that allows the characterization of amplitude and phase of electromagnetic wave-fields in the far-field with a spatial accuracy that corresponds to a few nanometers in the object plane. Emphasis is put on the precise determination of topological features in the wave-field, called phase singularities or vortices, which are spatial points within the electromagnetic wave at which the amplitude is zero and the phase is hence not determined. An experimental tool working in transmission with a resolution of 20 nm in the object plane is presented and its application to the optical characterization of various single and periodic nanostructures such as trenches, gratings, microlenses and computer generated holograms is discussed. The conditions for the appearance of phase singularities are theoretically and experimentally outlined and it is shown how dislocation pairs can be used to determine unknown parameters from an object. Their corresponding applications to metrology or in optical data storage systems are analyzed. In addition, rigorous diffraction theory is used in all cases to simulate the interaction of light with the nano-optical structures to provide theoretical confirmation of the experimental results.
  • Publication
    Accès libre
    Measuring optical phase singularities at subwavelength resolution
    (2004) ;
    Märki, Iwan
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    Salt, Martin Guy
    ;
    Nesci, Antonello
    We will present experimental and theoretical studies of optical fields with subwavelength structures, in particular phase singularities and coherent detection methods with nanometric resolution. An electromagnetic field is characterized by an amplitude, a phase and a polarization state. Therefore, experimental studies require coherent detection methods, which allow one to measure the amplitude and phase of the optical field with subwavelength resolution. We will present two instruments, a heterodyne scanning probe microscope (heterodyne SNOM) and a high resolution interference microscope (HRIM). We will review some earlier work using the heterodyne SNOM, in particular the measurement of phase singularities produced by a 1 µm pitch grating with 10 nm spatial sampling. Using the HRIM we have investigated the intensity and phase distributions (with singularities) in the focal region of microlenses. The measurements are compared with the results calculated by rigorous diffraction theory.
  • Publication
    Accès libre
    High-resolution measurement of phase singularities produced by computer-generated holograms
    (2004)
    Rockstuhl, Carsten
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    Ivanovskyy, Andrey Albert
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    Soskin, Marat Samuil
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    Salt, Martin Guy
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    ;
    We present measurements of the intensity as well as the phase distribution in the various diffraction orders of computer-generated holograms designed to generate a higher order Gauss–Laguerre beam. For the direct measurement of the phase distribution in the diffraction orders a high-resolution interferometer is used, which allows access to a lateral length scale for the localization of phase singularities below the wavelength. It is experimentally shown that in beams that carry multiple singularities, the dislocations do not degenerate. This effect cannot be seen by analyzing only the intensity distribution of the laser beam.
  • Publication
    Accès libre
    Propagation of the electromagnetic field in fully coated near-field optical probes
    (2003)
    Vaccaro, L.
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    Aeschimann, L.
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    Staufer, U.
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    ;
    Fully metal-coated near-field optical probes, based on a cantilever design, have been studied theoretically and experimentally. Numerical simulations prove that these structures allow nonzero modal emission of the electromagnetic field through a 60-nm-thick metallic layer, that is opaque when deposited on flat substrates. The far-field intensity patterns recorded experimentally correspond to the ones calculated for the fundamental and first excited LP modes. Moreover, this study demonstrates that a high confinement of the electromagnetic energy can be reached in the near-field, when illuminated with radially polarized light. Finally, it was verified that the confinement of the field depends on the volume of the probe apex.
  • Publication
    Accès libre
    Micro-optical fiber switch for a large number of interconnects using a deformable mirror
    (2002)
    Peter, Yves-Alain
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    Gonte, Frédéric
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    ;
    In this letter, we demonstrate the limitations for 1 × N free space optical switch with a moving macro-lens. We use a deformable mirror to overcome these limitations. The adaptive mirror corrects for the aberrations. Power coupling efficiencies between 6 and 3 dB (including losses due to the optical elements) are feasible for an optical switch allowing up to 3019 receiver fibers.
  • Publication
    Accès libre
    Optical MEMS based on silicon-on-insulator (SOI) for monolithic microoptics
    (2002)
    Noell, Wilfried
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    Sun, Winston
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    de Rooij, Nicolaas F.
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    ;
    Manzardo, Omar
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    Microelectromechanical systems (MEMS) combined with optical components add optical functionality to devices and lead to the terms optical MEMS or MOEMS. The underlying technology of the presented devices is silicon-on-insulator (SOI) based batch fabrication, which delivers small, reliable and lasting monolithic bulk silicon structures for commercial devices with the advantage of being very insensitive to temperature changes. The particular strength of the technology is monolithic horizontal and vertical micromirrors for a variety of applications.
  • Publication
    Accès libre
    Applications of SOI-based optical MEMS
    (2002)
    Noell, Wilfried
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    Clerc, Pierre-André
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    Dellmann, Laurent
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    Guldimann, Benedikt
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    Manzardo, Omar
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    Marxer, Cornel
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    ;
    de Rooij, Nicolaas F.
    After microelectromechanical systems (MEMS) devices have been well established, components of higher complexity are now developed. Particularly, the combination with optical components has been very successful and have led to optical MEMS. The technology of choice for us is the silicon-on-insulator (SOI) technology, which has also been successfully used by other groups. The applications presented here give an overview over what is possible with this technology. In particular, we demonstrate four completely different devices: (a) a 2 × 2 optical cross connector (OXC)with an insertion loss of about 0.4 dB at a switching time of 500 μs and its extension to a 4 × 4 OXC, (b) a variable optical attenuators (VOA), which has an attenuation range of more than 50 dB (c) a Fourier transform spectrometer (FTS) with a spectral resolution of 6 nm in the visible, and (d) an accelerometer with optical readout that achieves a linear dynamic range of 40 dB over ±6 g. Except for the FTS, all the applications utilized optical fibers, which are held and self-aligned within the MEMS component by U-grooves and small leaf springs. All devices show high reliability and a very low power consumption.
  • Publication
    Accès libre
    Improved red color with cholesteric liquid crystals in Bragg reflection mode
    (2002)
    Kipfer, Peter
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    Klappert, Rolf
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    ;
    Grupp, Joachim
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    The helical pitch of the cholesteric liquid crystal (CLC) can be adjusted to reflect the colors red, green, and blue. Additive mixing of these colors in displays results in multicolor images and it is easy to use pure primary blue and green colors, but the red color is in general very unsaturated. We show by simulations that this poor red color performance is due to reflection sidebands on the smaller wavelength side of the normal red Bragg reflection band. We discuss five approaches to improve the red color performance, namely, two types of spectral filtering (dyes or filters), a very low birefringence CLC, a gradient in the birefringence of the CLC, and the use of a bluish reflector. The two methods of spectral filtering are also experimentally tested.
  • Publication
    Accès libre
    Measuring amplitude and phase distribution of fields generated by gratings with sub-wavelength resolution
    (2002)
    Nesci, A.
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    ;
    Salt, M.
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    In this paper, we intend to gain an understanding of the interaction of light with microstructures. Measurements of amplitude and phase in the diffracted field close to gratings using a heterodyne scanning probe are presented. Coherent light diffracted by microstructures produces periodic features and can give birth to phase dislocations, also called phase singularities. Phase singularities are isolated points where the amplitude of the field is zero. We present measurements of such phase singularities with 10 nm spatial sampling and compare them with theoretical results obtained from rigorous diffraction calculations. The observed polarization effects reveal also important information about the vectorial field conversion by the fiber tip.