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  4. Low repetition rate SESAM modelocked VECSEL using an extendable active multipass-cavity approach

Low repetition rate SESAM modelocked VECSEL using an extendable active multipass-cavity approach

Author(s)
Zaugg, C. A
Hoffmann, Martin  
Laboratoire temps-fréquence  
Pallmann, W. P
Wittwer, Valentin  
Laboratoire temps-fréquence  
Sieber, Oliver D
Mangold, Mario
Golling, Matthias
Weingarten, K. J
Tilma, B. W
Südmeyer, Thomas  
Laboratoire temps-fréquence  
Keller, Ursula
Date issued
2012
In
Optics Express, Optical Society of America
Vol
20
No
25
From page
27915
To page
27921
Abstract
Ultrafast VECSELs are compact pulsed laser sources with more flexibility in the emission wavelength compared to diode-pumped solid-state lasers. Typically, the reduction of the pulse repetition rate is a straightforward method to increase both pulse energy and peak power. However, the relatively short carrier lifetime of semiconductor gain materials of a few nanoseconds sets a lower limit to the repetition rate of passively modelocked VECSELs. This fast gain recovery combined with low pulse repetition rates leads to the buildup of multiple pulses in the cavity. Therefore, we applied an active multipass approach with which demonstrate fundamental modelocking at a repetition rate of 253 MHz with 400 mW average output power in 11.3 ps pulses.
Publication type
journal article
Identifiers
https://libra.unine.ch/handle/20.500.14713/65656
DOI
10.1364/OE.20.027915
-
https://libra.unine.ch/handle/123456789/8312
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Zaugg_C.A.-Low_repetition_rate_SESAM-20140811.pdf

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