X-ray photoelectron diffraction study of Cu(1 1 1): Multiple scattering investigation

Despont, Laurent; Naumovic, D.; Clerc, Florian; Koitzsch, Christian; Garnier, Michael Bernard Gunnar; Garcia de Abajo, F.J.; Van Hove, M. A.; Aebi, Philipp

doi:10.1016/j.susc.2005.10.038

X-ray photoelectron diffraction study of Cu(1 1 1): Multiple scattering investigation

Author(s)

Despont, Laurent

Naumovic, D.

Clerc, Florian

Koitzsch, Christian

Garnier, Michael Bernard Gunnar

Garcia de Abajo, F.J.

Van Hove, M. A.

Aebi, Philipp

Date issued

2006

In

Surface Science, Elsevier, 2006/600/2/380-385

Subjects

photoelectron diffraction multiple scattering copper electron solid interaction scattering diffraction

Abstract

Multiple scattering theory based on a cluster model is used to simulate full-hemispherical X-ray photoelectron diffraction measurements in order to verify how state of the art multiple scattering simulations are able to reproduce the experiment. This approach is applied to the Cu(1 1 1) surface for two different photoelectron kinetic energies. Differences and similarities between single and multiple scattering are discussed in comparison with experimental results. We find that the present approach gives very good results despite some limitations.