Fast parallel kriging-based stepwise uncertainty reduction with application to the identification of an excursion set
Author(s)
Bect, Julien
Ginsbourger, David
Vazquez, Emmanuel
Picheny, Victor
Richet, Yann
Date issued
2014
In
Technometrics
Vol
4
No
56
From page
455
To page
465
Publication type
journal article