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Fast parallel kriging-based stepwise uncertainty reduction with application to the identification of an excursion set
Auteur(s)
Bect, Julien
Ginsbourger, David
Vazquez, Emmanuel
Picheny, Victor
Richet, Yann
Date de parution
2014
In
Technometrics
Vol.
4
No
56
De la page
455
A la page
465
Identifiants
Type de publication
journal article