X-ray photoelectron diffraction study of ultrathin PbTiO<sub>3</sub> films
Author(s)
Despont, Laurent
Lichtensteiger, Céline
Clerc, F.
Garnier, Michael Bernard Gunnar
Garcia de Abajo, F.J.
Van Hove, M. A.
Triscone, Jean-Marc
Aebi, Philipp
Date issued
2006
In
European Physical Journal B (The) - Condensed Matter and Complex Systems, Institute of Physics (IOP), 2006/49/2/141-146
Subjects
quantum wires semiconductor surfaces scanning tunnelling microscopy
Abstract
Full hemispherical X-ray photoelectron diffraction (XPD) experiments have been performed to investigate at the atomic level ultrathin epitaxial c-axis oriented PbTiO<sub>3</sub> (PTO) films grown on Nb-doped SrTiO<sub>3</sub> substrates. Comparison between experiment and theory allows us to identify a preferential ferroelectric polarization state in a 60 Å -thick PTO film. Multiple scattering theory based on a cluster-model [ Phys. Rev. B <sub>63</sub>, 075404 (2001)] is used to simulate the experiments.
Publication type
journal article
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