Miniaturized time-scanning Fourier transform spectrometer based on silicon technology
Author(s)
Manzardo, Omar
Marxer, Cornel R.
de Rooij, Nicolaas F.
Herzig, Hans-Peter
Date issued
1999
In
Optics Letters, Optical Society of America, 1999/24/23/1705-1707
Subjects
spectroscopy Fourier transforms
Abstract
We present a miniaturized Fourier transform spectrometer (FTS) based on optical microelectromechanical system technology. The FTS is a Michelson interferometer with one scanning mirror. A new type of electrostatic comb drive actuator moves the mirror. We have measured a nonlinearity of the driving system of ±0.5 <i>μ</i>m for a displacement of 38.5 <i>μ</i>m . A method is presented to correct the spectrum to get rid of the nonlinearity. The driving reproducibility is ±25 nm. The measured resolution of the spectrometer after the phase correction is 6 nm at a wavelength of 633 nm.
Later version
http://ol.osa.org/abstract.cfm?id=37571
Publication type
journal article
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