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  4. Growth of thin Bi films on W(1 1 0)

Growth of thin Bi films on W(1 1 0)

Author(s)
Koitzsch, Christian
Bovet, M.
Clerc, Florian
Naumovic, D.
Schlapbach, Louis
Aebi, Philipp
Date issued
2003
In
Surface Science, Elsevier, 2003/527/1-3/51-56
Subjects
low energy electron diffraction (LEED) photoelectron diffraction measurement growth tungsten bismuth
Abstract
We report on the growth of single crystalline epitaxial Bi films on W(1 1 0). X-ray photoelectron diffraction (XPD) and low energy electron diffraction (LEED) reveal that Bi grows well ordered in the pseudocubic (0 0 1) orientation. The two-fold symmetric W(1 1 0) surface supports four different Bi(0 0 1) domains. The multi-domain nature is unambigously detected via LEED showing a peculiar splitting of spots. It is shown that a preferential domain alignment along the [0 0 1]<i>tungsten</i>-direction accounts for this observation and is in agreement with a two-fold XPD pattern.
Publication type
journal article
Identifiers
https://libra.unine.ch/handle/20.500.14713/60122
DOI
10.1016/S0039-6028(02)02534-7
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Koitzsch_C._-_Growth_of_thin_Bi_films_20080410.pdf

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