Towards a planar sample support for in situ experiments in structural biology

Gullo, M. R.; Akiyama, Terunobu; Frederix, P. L. T. M.; Tonin, A.; Staufer, Urs; Engel, A.; de Rooij, Nicolaas F.

doi:10.1016/j.mee.2004.12.072

Towards a planar sample support for in situ experiments in structural biology

Author(s)

Gullo, M. R.

Akiyama, Terunobu

Frederix, P. L. T. M.

Tonin, A.

Staufer, Urs

Engel, A.

de Rooij, Nicolaas F.

Date issued

2005

In

Microelectronic Engineering, Elsevier, 2005/78-79//571-574

Subjects

Nano Nanotechnology Biology Nanobiology Structural biology Biological membrane Patch-clamp Conductive probe Scanning electrochemical microscopy

Abstract

We report about the development of a planar support for biological samples. The aim is to combine AFM and patch-clamp measurements, in order to perform simultaneous measurements of topography and electrical properties of biological membranes. Sub-micrometer apertures have been fabricated using standard MEMS techniques. The electrical quality of the support has been experimentally assessed.